Penkiakalbis aiškinamasis metrologijos terminų žodynas. – Vilnius: Mokslo ir enciklopedijų leidybos institutas. Vytautas Valiukėnas, Pranas Juozas Žilinskas. 2006.
ion probe — joninis zondas statusas T sritis fizika atitikmenys: angl. ion probe; ionic probe vok. Ionensonde, f rus. ионный зонд, m pranc. sonde ionique, f … Fizikos terminų žodynas
Ion beam analysis — ( IBA ) is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition and obtain elemental depth profiles in the near surface layer of solids. All IBA methods are highly sensitive and allow the … Wikipedia
Ion thruster — An ion thruster is a form of electric propulsion used for spacecraft propulsion that creates thrust by accelerating ions. Ion thrusters are characterized by how they accelerate the ions, using either electrostatic or electromagnetic force.… … Wikipedia
ionic probe — joninis zondas statusas T sritis Standartizacija ir metrologija apibrėžtis Labai mažo skersmens fokusuotas jonų pluoštas. atitikmenys: angl. ion probe; ionic probe vok. Ionensonde, f rus. ионный зонд, m pranc. sonde ionique, f … Penkiakalbis aiškinamasis metrologijos terminų žodynas
ionic probe — joninis zondas statusas T sritis fizika atitikmenys: angl. ion probe; ionic probe vok. Ionensonde, f rus. ионный зонд, m pranc. sonde ionique, f … Fizikos terminų žodynas
Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… … Wikipedia
Atom probe — The atom probe is an atomic resolution microscope used in materials science that was invented in 1967 by Erwin Müller, J. A. Panitz, and S. Brooks McLane [cite journal|last=Müller|first=Erwin W.|authorlink=Erwin Müller|coauthors=John A. Panitz, S … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Scanning Helium Ion Microscope — Ein Helium Ionen Mikroskop (auch: Scanning Helium Ion Microscope, SHIM) ist ein bildgebendes Verfahren, welches darauf basiert, dass ein Helium Ionen Strahl das zu untersuchende Objekt abtastet[1]. Das Verfahren ähnelt dem eines… … Deutsch Wikipedia
Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the … Wikipedia
